Lehigh Surface Analysis Symposium

Lehigh University is now home to two unique surface analysis instruments that are the only such advanced surface characterization instruments in North America: ...

ION-TOF Qtac 100 High Sensitivity-Low Energy Ion Scattering (HS-LEIS) and Scienta ESCA-300 High Resolution-X-ray Photoelectron Spectroscopy (HS-XPS). A symposium was held on March 23, 2011, highlighting their advanced capabilities with lectures and posters to demonstrate its applications which also included a laboratory tour.

Symposium webpage: http://www.lehigh.edu/operando/symposium.html